In situ reflection electron microscopy for the surface processes analysis during sublimation and epitaxial growth of layered metal chalcogenides
Sergei A. Ponomarev, Dmitry I. Rogilo, Konstantin E. Zakhozhev, Dmitry A. Nasimov, Nina N. Kurus, Anton K. Gutakovskii, Konstantin A. Kokh, Alexander G. Milekhin, Dmitry V. Sheglov, Alexander V. Latyshev
Volume 10, Issue 4, 251-261
Communication , 30 December 2024