Keywords
Abstract
Charged domain walls (CDWs) in ferroelectric materials are of interest from both fundamental and applied perspectives due to their unique electrophysical properties, which differ significantly from those of the bulk material. Until recently, research efforts primarily focused on studying these properties, while less attention was given to the finite-thickness regions of CDWs with heterogeneous electrical conductivity. This study proposes a model describing the charge carrier distribution within the conductive region of CDWs. The dependencies of charge carrier concentration and mobility on the distance from the CDW were determined. An analytical expression for current-voltage characteristics, measurable by conductive atomic force microscopy (c-AFM), was also proposed. The model has been experimentally validated using AFM methods.