Modern Electronic Materials

Modern Electronic Materials, 2026, Volume 12, Issue 3
2026, Volume 12, Issue 3
30 September 2026

Modern Electronic Materials (MOEM) is a peer-reviewed, open-access scientific journal published by the
National University of Science and Technology MISIS (NUST MISIS).

The journal publishes original research articles, reviews and communications in the field of electronic and functional materials, with particular emphasis on relationships between material synthesis and processing, structure, physical properties and applications.

Print ISSN: 2452-2449
Electronic ISSN: 2452-1779
Open Access

Recent articles

Study of the design and fabrication characteristics of silicon-based detectors usingtwo-photon absorption
Artyom A. Sharapov, Alexey V. Sidelev, Konstantin I. Tapero, Alexander S. Vatuev, Artyom E. Zemtsov
Volume 12, Issue 3
Article , 30 September 2026
Challenges and strategy for developing efficient thermoelectric materials based on zinc and magnesium antimonides
Alexey Sherchenkov, Yuriy Shtern, Alina Lavrenova, Maxim Rogachev, Maxim Shtern, Yuri N. Parkhomenko
Volume 12, Issue 3
Review , 30 September 2026
Doped polysilicon films transverse resistance at low implantation doses
Igor Syrykh, Sergey Bogdanov
Volume 12, Issue 3
Article , 30 September 2026
Effect of preliminary rapid annealing on the photoluminescence of nanosized silicon inclusions in multilayered SiOx/SiO2 and SiOx/ZrO2 structures  
Alexey V. Ershov, Daniil A. Yushkov, Mikhail E. Suvorov, Anton V. Zdoroveyshchev, Nikolay V Baidus
Volume 12, Issue 2, 65-69
Article , 30 June 2026
Propylene carbonate based organic electrolytes for supercapacitors used in portable electronics power sources  
Svetlana V. Stakhanova, Lyudmila A. Puntusova, Lidiya A. Gurchenkova, Elizaveta V. Shmakova, Ilya S. Krechetov, Lev V. Kozhitov
Volume 12, Issue 2, 71-82
Article , 30 June 2026
Prediction of ferroelectric properties of (K,Na)NbO3-based solid solutions with the aid of interpretable descriptors  
Tatiana S. Ilina, Sofia V. Torianik, Dmitrii S. Zakhidov, Dmitry A. Kiselev
Volume 12, Issue 2, 83-94
Article , 30 June 2026
1.534 µm Er electroluminescence in the RF magnetron deposited In2O3 : Er films on a Si substrate  
Konstantin V. Feklistov, Alexey G. Lemzyakov, Demid S. Abramkin, Kirill A. Svit, Alexey M. Pugachev, Vladimir A. Volodin, Denis V Marin, Evgeny V. Spesivsev, Ivan A. Azarov, Leonid N. Safronov, Sergey A. Kochubey, Kirill S. Ershov, Aleksandr V. Kapishnikov, Alexander N. Shmakov, Alexander A. Shklyaev, et. al.
Volume 12, Issue 2, 95-102
Article , 30 June 2026
Structural and electrical properties of PSi/CNT junction
Zyad Attia Dawood, Abdulkhaliq A. Sulaiman, Hanaa E. Jasim
Volume 12, Issue 2, 103-110
Article , 30 June 2026

Journal metrics

SCImago Journal & Country Rank
  • CiteScore 2025 (Scopus) 0.9, Q4

Indexing databases

Article types

  • Article
  • Review
  • Communication

Editorial Board

Editor-in-Chief

National University of Science and Technology “MISIS”, Moscow, Russia

Deputy Editor-in-Chief

Skolkovo Institute of Science and Technology,

Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

Associate Editors

National University of Science and Technology “MISIS”, Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

Subject Editors

National Research Center "Kurchatov Institute",

Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

Lomonosov Moscow State University, Moscow, Russia

National University of Science and Technology “MISIS”, Moscow, Russia

National Research University of Electronic Technology (MIET)

Zelenograd, Moscow, Russia

Aveiro University, Department of Physics, Aveiro, Portugal

A.M. Prokhorov General Physics Institute, Russian Academy of Sciences, Moscow, Russia

Scientific-Practical Materials Research Centre of the NAS of Belarus, Minsk, Belarus

Scientific-Practical Materials Research Centre of the NAS of Belarus, Minsk, Belarus

Editorial Board Members

Rzhanov Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences, Novosibirsk, Russia

Department of Physics, University of Oviedo, Oviedo, Spain

Scientific-Practical Materials Research Centre of the NAS of Belarus, Minsk, Belarus

CICECO - Aveiro Institute of Materials, University of Aveiro, Aveiro, Portugal

Centro de Investigaciones en Optica (Center for Optics Research), Leon, Mexico

Chonbuk National University, School of Advanced Materials Engineering, Jeonju, Republic of Korea

A.M. Prokhorov General Physics Institute, Russian Academy of Sciences, Moscow, Russia

Al Farabi Kazakh National University, Institute of Combustion Problems, Almaty, Kazakhstan

Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, MR, Russia

XRD Eigenmann GmbH, Schnaittach, Germany

Institute for Materials Science, University of Duisburg-Essen, Essen, Germany

Complutense University of Madrid, Madrid, Spain

Ioffe Physical-Technical Institute of the Russian Academy of Sciences, St Petersburg, Russia

Rheinisch-Westfalische Technische Hochschule Aachen, Institute of Materials in Electrical Engineering and Information Technology II, Aachen, Germany

NanoTech Institute, University of Texas at DallasRichardson, TX, United States of America