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Synthesis of silicon-carbon films by induction-assisted plasma-chemical deposition

,  ,  ,  ,  ,  , 
Elena A. Skryleva 1
Elena A. Skryleva
,  , 
Igor A. Salimon 3
Igor A. Salimon
, 
Nikolai V. Batrameev 4
Nikolai V. Batrameev
,  , 
1 National University of Science and Technology “MISIS”, 4-1 Leninsky Ave., Moscow 119049, Russian Federation
2 Departamento de Física and i3N, Universidade de Aveiro, 3810-193 Aveiro, Portugal
3 Skolkovo Institute of Science and Technology, territory of the Innovation Center “Skolkovo”, 30-1 Bolshoy Blvd, Moscow 121205, Russian Federation
4 JSC “Piezo”, 16 Buzheninova Str., Moscow 107023, Russian Federation
Published 12 December 2023
Communication , Volume 9, Issue 4, 177-184
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Temirov A. A. et al. Synthesis of silicon-carbon films by induction-assisted plasma-chemical deposition // Modern Electronic Materials. 2023. Vol. 9. No. 4. pp. 177-184.
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Temirov A. A., Kubasov I. V., Turutin A. V., Ilina T. S., Kislyuk A. M., Kiselev D. A., Skryleva E. A., Sobolev N. A., Salimon I. A., Batrameev N. V., Malinkovich M. D., Parkhomenko Y. N. Synthesis of silicon-carbon films by induction-assisted plasma-chemical deposition // Modern Electronic Materials. 2023. Vol. 9. No. 4. pp. 177-184.
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TY - JOUR
DO - 10.3897/j.moem.9.4.116552
UR - https://moem.colab.ws/publications/10.3897/j.moem.9.4.116552
TI - Synthesis of silicon-carbon films by induction-assisted plasma-chemical deposition
T2 - Modern Electronic Materials
AU - Temirov, Alexander A.
AU - Kubasov, Ilya V.
AU - Turutin, Andrei V.
AU - Ilina, Tatiana S.
AU - Kislyuk, Alexander M.
AU - Kiselev, Dmitry A.
AU - Skryleva, Elena A.
AU - Sobolev, Nikolai A.
AU - Salimon, Igor A.
AU - Batrameev, Nikolai V.
AU - Malinkovich, Mikhail D.
AU - Parkhomenko, Yuri N.
PY - 2023
DA - 2023/12/12
PB - НИТУ МИСИС
SP - 177-184
IS - 4
VL - 9
ER -
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@article{2023_Temirov,
author = {Alexander A. Temirov and Ilya V. Kubasov and Andrei V. Turutin and Tatiana S. Ilina and Alexander M. Kislyuk and Dmitry A. Kiselev and Elena A. Skryleva and Nikolai A. Sobolev and Igor A. Salimon and Nikolai V. Batrameev and Mikhail D. Malinkovich and Yuri N. Parkhomenko},
title = {Synthesis of silicon-carbon films by induction-assisted plasma-chemical deposition},
journal = {Modern Electronic Materials},
year = {2023},
volume = {9},
publisher = {НИТУ МИСИС},
month = {Dec},
url = {https://moem.colab.ws/publications/10.3897/j.moem.9.4.116552},
number = {4},
pages = {177--184},
doi = {10.3897/j.moem.9.4.116552}
}
MLA
Cite this
MLA
Temirov, Alexander A., et al. “Synthesis of silicon-carbon films by induction-assisted plasma-chemical deposition.” Modern Electronic Materials, vol. 9, no. 4, Dec. 2023, pp. 177-184. https://moem.colab.ws/publications/10.3897/j.moem.9.4.116552.
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Keywords

diamond-like materials
plasma-chemical deposition
silicon-carbon films
thin film technologies

Abstract

Silicon-carbon films are of great interest as diamond-like materials combining unique properties, e.g. high hardness, adhesion to a wide range of materials, abrasion resistance, chemical resistance, low friction coefficient and biocompatibility. The presence of silicon in the films significantly reduces their inner mechanical stress as compared to diamond films. Currently, the films are used in industry, primarily, as solid lubricants and protective coatings. There are a large number of silicon-carbon film synthesis methods the most widely used of which are various options of chemical vapor deposition. A new silicon-carbon film synthesis technique has been suggested and tested. The technique is based on the use of high-frequency induction for obtaining plasma of silicon and carbon vapors supplied to the reaction chamber from an external source. Impurity-free silicon-carbon films containing 63–65 % carbon atoms with sp3 orbital hybridization have been synthesized on Sitall substrates. The composition, surface roughness and friction coefficient of the impurity-free silicon-carbon films synthesized using the suggested technology have been studied. The possibility of implementing resistive switching in thin silicon-carbon films in cross-bar structures with metallic electrodes has been analyzed.

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