Home / Articles / Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites

Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites

Kevin Abraham1 1
Kevin Abraham1
, 
A.K. Thomas1 1
A.K. Thomas1
, 
Jini Thomas2 1
Jini Thomas2
, 
K.V. Saban3 1
K.V. Saban3
1 1
10.3897/j.moem.5.46694
Published 31 December 2019
Communication , Volume 5, Issue 4, 145-150
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Abraham1 K. et al. Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites // Modern Electronic Materials. 2019. Vol. 5. No. 4. pp. 145-150.
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Abraham1 K., Thomas1 A., Thomas2 J., Saban3 K. Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites // Modern Electronic Materials. 2019. Vol. 5. No. 4. pp. 145-150.
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TY - JOUR
DO - 10.3897/j.moem.5.46694
UR - https://moem.colab.ws/publications/10.3897/j.moem.5.46694
TI - Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites
T2 - Modern Electronic Materials
AU - Abraham1, Kevin
AU - Thomas1, A.K.
AU - Thomas2, Jini
AU - Saban3, K.V.
PY - 2019
DA - 2019/12/31
PB - НИТУ МИСИС
SP - 145-150
IS - 4
VL - 5
ER -
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@article{2019_Abraham1,
author = {Kevin Abraham1 and A.K. Thomas1 and Jini Thomas2 and K.V. Saban3},
title = {Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites},
journal = {Modern Electronic Materials},
year = {2019},
volume = {5},
publisher = {НИТУ МИСИС},
month = {Dec},
url = {https://moem.colab.ws/publications/10.3897/j.moem.5.46694},
number = {4},
pages = {145--150},
doi = {10.3897/j.moem.5.46694}
}
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Abraham1, Kevin, et al. “Steady nature of dielectric behaviour in Sm1.5Sr0.5NiO4 – CCTO composites.” Modern Electronic Materials, vol. 5, no. 4, Dec. 2019, pp. 145-150. https://moem.colab.ws/publications/10.3897/j.moem.5.46694.
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Keywords

composite
dielectric constant
impedance spectroscopy
powder XRD

Abstract

The composite materials of 0.5 Sm1.5Sr0.5NiO4, 0.5 CCTO and 0.75 Sm1.5Sr0.5NiO4, 0.25 CCTO mixtures were prepared through the conventional solid state reaction in an attempt to obtain good dielectric properties for practical applications. The structural properties were determined by powder X-ray diffraction and single phases were obtained for Sm1.5Sr0.5NiO4 and CaCu3Ti4O12 compounds. The dielectric studies analysed over a range of frequencies (100 KHz–10 MHz) and temperatures (30 to 200 °C) revealed a desired dielectric constant values with a low steady nature of dielectric loss factor. Through impedance spectroscopy, the attained dielectric behaviour was due to the highly insulating grain boundaries at lower frequencies and semiconducting grains at higher frequencies.

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